X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd

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Rigaku X-Ray

 

Mini-Z Series


BENCHTOP SINGLE ELEMENT WAVELENGTH DISPERSIVE XRF ANALYZER

High-precision, high-sensitivity elemental analysis

A series of compact benchtop wavelength dispersive XRF analyzers, the Mini-Z series of analyzers are designed for analyzing specific single elements. Since the optics are optimally configured to a particular element, this series allows for high precision and low detection limits.

High precision single element analysis

Mini-Z can be configured as a Si analyzer (e.g., for coated Si on paper or plastic), an Al analyzer (e.g., for coated Al on paper or plastic), a Ni analyzer, (e.g., for Ni coating or plating), a Cl analyzer, a P analyzer (e.g., biofuels) or a Zr analyzer (e.g., for Zr coating).

Self contained elemental analyzer

The Rigaku Mini-Z series benchtop WDXRF spectrometers are completely contained X-ray generating systems. Interlocks and safety "X-RAY ON" indicators are present to protect operators from exposure to X-rays being produced. The spectrometers meet all North American safety codes and are CE marked.

Features

  • Excellent LLD

  • Peak and background measurements

  • Easy-to-operate software

  • No cooling water, plug-n-play

  • Light weight and compact body

  • Exceptional repeatability

  • Wide analysis range

  • High-resolution, wavelength dispersive optics

  • No complex sample preparation required (reagent treatment, etc.)

 

 

 

 

X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd
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