X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd

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X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd

13th July 2021
SmartLab XRD solution for semiconductor materials

Title 

SmartLab XRD Solution for Semiconductor Materials

Description High resolution X-ray diffraction is a versatile and powerful tool in semiconductor materials and devices. Quick and non-destructive characterization of thickness, composition, quality, orientation, lattice strain, etc. are possible by XRD. This webinar will cover different high-resolution optics available at SmartLab diffractometer for the basic and sophisticated characterization of epitaxial layers. Various high-resolution techniques such as rocking curve, reciprocal space map etc. will be discussed.
Time Jul 21, 2021 04:00 PM

 

 

X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd
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