X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd
13th July 2021 SmartLab XRD solution for semiconductor materials
Title
SmartLab XRD Solution for Semiconductor Materials
Description
High resolution X-ray diffraction is a versatile and powerful tool in semiconductor materials and devices. Quick and non-destructive characterization of thickness, composition, quality, orientation, lattice strain, etc. are possible by XRD. This webinar will cover different high-resolution optics available at SmartLab diffractometer for the basic and sophisticated characterization of epitaxial layers. Various high-resolution techniques such as rocking curve, reciprocal space map etc. will be discussed.
Time
Jul 21, 2021 04:00 PM
X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd
